繁體中文
訂購(gòu)熱線:021-3463-5258 021-3463-5259
訂購(gòu)熱線:021-3463-5258 021-3463-5259
| Holoeye空間光調(diào)制器 | ALPAO高速變形鏡 | 波前分析儀Phasics | 自適應(yīng)光學(xué)系統(tǒng) | 數(shù)字微反射鏡 DMD 數(shù)字微鏡器件 | 光學(xué)元件器件DOE | 光刻儀 |
| 飛秒激光器 | 皮秒激光器 | 自相關(guān)儀 | 超短脈沖測(cè)量?jī)xFrog | 超快激光器件 |
| 高功率連續(xù)波OPO | 高功率光纖激光器 | Qioptiq NANO 激光器 | 低噪聲窄線寬激光器 | 可調(diào)諧激光器 | 半導(dǎo)體激光器和放大器 | SLD和ASE寬帶光源 | 雙波長(zhǎng)輸出氦氖激光器 |
| QIOPTIQ光纖耦合半導(dǎo)體激光器 | Diode & DPSS_qioptiq | 激光驅(qū)動(dòng)白光光源 | 等離子體寬帶光源 | 單色儀 | 光譜儀 | 光柵 | 輻射計(jì) | 防嗮系數(shù)分析 | Optogma固體激光器 | Solarlight | 波長(zhǎng)選擇器 |
| 激光準(zhǔn)直儀 | 紅外激光觀察鏡 | 激光功率能量計(jì) | 光學(xué)斬波器 | 光束質(zhì)量分析儀 | 位敏探測(cè)器 | 紅外相機(jī) | O/E轉(zhuǎn)換模塊探測(cè)器 TIA-525S |
| 太赫茲相機(jī)及源 | 太赫茲探測(cè)器 | 太赫茲元器件及晶體 | 太赫茲光譜儀 | 太赫茲功率計(jì) |
| Optiphase | 微光MOI |
| 普克爾盒/Pockels Cells | 電光調(diào)制器/Electro-Optics Modulators | 法拉第隔離器/Faraday Isolators | SESAM半導(dǎo)體可飽和吸收鏡 | 探測(cè)器 | EOT高速光電探測(cè)器 | 其他未分類(lèi) |
| 電化學(xué)ECV 擴(kuò)散濃度 | 接觸電阻測(cè)量?jī)x | 四點(diǎn)探針測(cè)試儀 | 少子壽命測(cè)試儀 |
| 平行光管 |
| 光纖跳線及配件 | 無(wú)源器件 |
 |
為滿足廣大客戶在真空環(huán)境中對(duì)激光光束質(zhì)量，氣流，等離子體密度測(cè)量分析，以及光學(xué)系統(tǒng)裝配的需求。法國(guó)phasics推出了新型高精度波前分析儀sid4-v，是目前市場(chǎng)上僅有一款可應(yīng)用于真空度在10-6 mbar環(huán)境中的波前分析儀，廣泛應(yīng)用于高功率激光測(cè)試中。
產(chǎn)品特點(diǎn)：
可適用于＞10-6mbar真空環(huán)境
高分辨率160×120相位像素
光譜范圍從400 nm到1100 nm
可測(cè)量發(fā)散光束
熱和機(jī)械真空不改變測(cè)試結(jié)果
真空循環(huán)下無(wú)任何性能下降
真空和常壓下均可使用
產(chǎn)品參數(shù)：
真空相容性 | 10-6mbar |
波長(zhǎng)范圍 | 400 - 1100 nm |
通光孔徑 | 3.6 x 4.8 mm2 |
空間分辨率 | 29.6 μm |
采樣點(diǎn)（相位/強(qiáng)度） | 160 x 120 (> 19 000 points) |
相位相對(duì)靈敏度 | < 2 nm rms |
相位精度 | 10 nm rms |
動(dòng)態(tài)范圍 | > 100 μm |
采樣頻率 | > 100 fps |
實(shí)時(shí)分析頻率 | > 10 fps (full resolution) |
數(shù)據(jù)接口 | giga ethernet |
尺寸(w x h x l) | 54 x 46 x 75.3 mm |
重量 | ~250 g |
關(guān)于phasics：法國(guó)phasics公司自主研發(fā)的波前傳感器是基于其專(zhuān)利的四波橫向剪切干涉技術(shù)。相較傳統(tǒng)的夏克-哈特曼波前探測(cè)器具有高分辨率、消色差、高靈敏度、高動(dòng)態(tài)檢測(cè)范圍、操作簡(jiǎn)便等獨(dú)特的優(yōu)勢(shì)。為波前像差、波前畸變的檢測(cè)以及激光光束及波前的測(cè)量、分析等提供了全新的解決方案。 法國(guó)phasics波前傳感器生產(chǎn)廠家具有雄厚的技術(shù)研發(fā)實(shí)力，能為客戶提供的各種自適應(yīng)光學(xué)系統(tǒng)oa-sys，制定個(gè)性化解決方案?？筛鶕?jù)客戶的應(yīng)用需求。
波前分析儀主要應(yīng)用領(lǐng)域：
1. 激光光束參數(shù)測(cè)量：相位（2d/3d），m2，束腰位置，直徑，澤尼克/勒讓德系數(shù)
2. 自適應(yīng)光學(xué)：焦斑優(yōu)化，光束整形
3. 元器件表面質(zhì)量分析：表面質(zhì)量（rms，ptv，wfe），曲率半徑
4. 光學(xué)系統(tǒng)質(zhì)量分析：mtf, psf, efl, 澤尼克系數(shù), 光學(xué)鏡頭/系統(tǒng)質(zhì)量控制
5. 熱成像分析，等離子體特征分析
6. 生物應(yīng)用：蛋白質(zhì)等組織定量相位成像
Phasics is innovating by proposing the first off-the-shelf vacuum compatible wavefront sensor on the market. The SID4 Vis designed to perform wavefront measurements under high vacuum. the wavefront measurement is realized in-situ in the same condition as the experiment. Our new SID4 V vacuum wavefront sensor is also used to characterize laser beams after compression inside the compressor vessel. Finally, gas jet and plasma density are now measured as close to the target as possible.
BENEFITS: With Phasics’s unique strategy it’s now possible to correct the aberrations of every single optical element up to the target location inside the vacuum chamber.
VACUUM COMPATIBLE & HIGH RESOLUTION | DESIGNED FOR VACUUM DOWN TO 10-6 mbar
?
| Vacuum compatibility | > 10-6 mbar |
| Wavelength range | 400 - 1100 nm |
| Aperture dimension | 4.73 x 3.55 mm2 |
| maximum NA (optional software necessary) | 0.2 |
| Spatial resolution | 29.6 μm |
| Phase & intensity sampling | 160 x 120 |
| Accuracy | 15 nm RMS |
| Resolution (Phase) | 2 nm RMS |
| Acquisition rate | 60 fps |
| Real-time processing frequency | 7 Hz (full resolution) |
| Interface | Giga Ethernet |
| MTBF | > 10 years |
| Dimensions (w x h x l) | 54 x 46 x 75.3 mm |
| Weight | ~ 250 g |
SID4 DENSITY software package supports the whole process to measure gas and plasma electron density. It calculates density maps from phase acquisition. It also offers various options for acquisition and data analysis.
| WORKING CONDITIONS | |
| Application | Any axisymmetric monoatomic gas jet/plasma for inverse-Abel transform analysis |
| Probe source | White light (halogen), LED, laser or fs-laser |
| Pressure | From 2 to 300 bars |
| Plasma length | Depends on the imaging system (typically 2 mm long and diameter of 0.2 mm) |
| SOFTWARE | |
| Acquisition | Real Time, programmed, trigger |
| Settings | Wavelength, magnification, jet direction, gas type |
| Analysis | Density map & profiles, Symmetrization, filters |
Performances such as the spatial resolution or the density resolution entirely depend on both the optical set-up (imaging system, probe source) and the injected gas (molar refractivity). Please contact us for an estimation of specifications for your set-up.
As an example, for an laser produced plasma using an Argon gas jet at working pressure between 2 and 300 bars, the lowest measured Argon density in a single shot is: 1017 particles/cm3 with a nozzle of 1.5 mm diameter.
| 
| 
| 
| ||||||||||||||||||||||||
| 
| 
| 
| ||||||||||||||||||||||||
| |||||||||||||||||||||||||||
